FROM311L, FPD TESTER System, is a TESTER SYSTEM testing ARRAY and CELL of organic EL and LCD being used in DISPLAY products. FROM311L is a TEST SYSTEM detecting defects of Device in advance by inspecting Defects [Point White/Black, Line Defect] by obtaining image Data of each Pixel by applying electrical signals on each Pixel circuit of glass circuit board * Effects - Increase in Product Yield. → Cost reduction and cost-competitiveness - Secure product reliability. * Applications - LTPS( Low Temperature Poly Silicon ), AM OLED Array & Cell Test - Powerful Defect Detection( Point, V/H Line , Stain Defect, Spin Defect & White/Black) * Features - Mixed Signal Base, Low Noise Design - High Speed Signal transmission by High Resolution A/D function - Max Test Rate : 80MHz( Digital Test Speed ) - Maximum Input pixels : 380 Mega * Max. 8CHs - Quick & Easy Test Program development environment( Use Excel Sheet ) - Automatic Create Test Program Recipe - Array Test for LTPS( LCD & OLED ) - All of Defects Detection (Point, Line, Geometric Test, White/Black, Spin etc.) - Improve productivity & Save cost. Previously encapsulation phase, the production cost curtailment which leads defectiveness detection - Flexible test result by Converter.( ex. Win2SDI => Only SDI ) - Available Powerful +Visual GUI Debug utility for analysis