Wafer test system(WTS) Provides best EDS testing enviroment through completed Burn In Test and pre-laser Test. * Concept - Wafer burn In Test + Pre-Laser Test : EDS Testing Process Integration - Low cost test function system ( R/A, Read/ Write function, etc) - Maximization of productivity (Separate control per station: 2 Tester/1System) * Effects - Nor flash EDS Test & TACT time reduction - EDS Tester Investment reduction - Productivity improvement * Applications - WBI + PRE-LASER TEST (NAND-flash, NOR-FLASH, MCP ,DRAM, SRAM, etc) * Features - Nor flash EDS test process integration (WBI + PRE LASER) - Test rate : 20MHz; - Read/Write function - Redundancy algorithm - Read function through the addition of comparator - I/O : Per pin Function - Pin : Pin merge mode/per pin - High voltage /range (16V,32V) - Separate control per station : Available to test 2 devices/ 1system (Productivity improvement) - Independent power supply for each die - Multi-tasking graphical user interface environment