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Unbranded

ATE(Automated Test Equipment)

  • Payment
    T/T
  • MOQ
    Negotiable
  • Country of sale
    World Wide
  • PRICE
    • FOB

      Depend on quantity

ITEM SPECIFICS

  • Brand
    Unbranded
  • origin
    Republic of Korea
  • Size(Capacity)


PRODUCT DESCRIPTION

* Applications - Target Device : NAND FLASH MEMORY * FEATURES - High throughput & Cost effective Architecture - Test rate : 80 MHz (with R/A), 100 MHz (without R/A) - RA Function with SUB-RA (CPU) - FAM Function - Multi-Tasking Graphical User Interface Environment - I/O: Per-pin function - Small footprint - SEMI S2/EMC Compliance

PAYMENTS DETAILS

This supplier supports payments for offline orders
  • Telegraphic Transfer : T/T
Contact Payment Manager
  • Name : LIM GWANG BIN

SHIPPING

Shipping from : Republic of Korea
  • 17-15 4sandan 7-ro Jiksan-eup Seobuk-gu, Cheonan-si, Chungcheongnam-do (31040)
Can't find a valid Shipping method for supplier account. Please contact the pertaining representative for detailed information.
WI
  • The person in charge

    Ikseong Byeon
  • Address

    17-15 4sandan 7-ro Jiksan-eup Seobuk-gu, Cheonan-si, Chungcheongnam-do (31040)
Introduction
.
  • Business Type :
    Manufacturer
  • Main Product :
  • Established :
    1998-01-01

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COMPARISON TO SIMILAR ITEMS more

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supplier level
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Seller's Store url
  • Response Level
      41% ~ 50%
  • Supplier Level
      Less than 100 million (KRW)
  • Transaction Level
      less than 5
SUPPLIER BEST
  • WTS(Wafer Test System)
  • MBT(Monitoring Burn In Test System)