1) Spectroscopic Ellipsometry (SE) has became the standard for measuring thin film thickness and optical constants(n and k). Spectroscopic Ellipsometry is used for characterization of all types of film like dielectrics, semiconductors, organics and more. We offer ellipsometers covering a wide spectral range of application to meet any need.
2)ELLi-RI with Integrating Sphere offers highly accurate measurements of film thickness
of a veriety materials exclusively including SiN antireflective coatings on textured multicrystalline and /or monocrystalline silicon solar cells.